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主管:北京市科学技术研究院         主办:北京自动测试技术研究所

《电子测试:新电子》

国内刊号:11-3927/TN   国际刊号:1000-8519

投稿邮箱:qkbjb126@163.com

主管单位:北京市科学技术研究院

主办单位:北京自动测试技术研究所

刊  期:月刊

开  本:16开

邮发代号:82-870

国内刊号:11-3927/TN
国际刊号:1000-8519
复合影响因子: 0.457
综合影响因子: 0.213
创刊时间:1994
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电子测试杂志社/杂志简介

Journal of electronic testing agency / magazine

《电子测试》(半月刊)创刊于1983年,由北京自动测试技术研究所主办。北京市科学技术研究院主管,国内外公开发行的科技类专业刊物。以介绍最新电子技术和测试测量技术为主,秉承一贯的专业性和权威性的办刊宗旨,坚持前瞻性、技术性和实用性的编辑方针,为测试测量及自动控制业界的工程师和技术研发人员提供了全新可靠的技术与应用和行业资讯。

"Electronic test" (semimonthly) was founded in 1983, organized by the Beijingauto testing technology research. The head of Beijing Municipal Institute of science and technology, science and technology specialty publications issued at home and abroad. To introduce the latest electronic technology and test and measurement technology, uphold the professional and authoritative publication purpose, adhere to the prospective, technical and practical editing guidelines fortest, measurement and automatic control of the industry engineers and technical R & D personnel to provide a new and reliable technology and application and industry information.

《电子测试》见证了中国电子测试测量业的发展历程。如何为国际和国内市场提供有竞争力的产品、掌握先进的测试测量技术一直以来深受测试测量领域工程师和研究者的关注,而为他们搭建沟通行业信息的平台,开创学术交流的广阔空间则正是《电子测试》创刊以来的核心使命。目前,众多科研院所、大专院校的科研精英和国内从事微电子行业和电子产品开发的科技人员已成为其忠实的读者群,我们的发行在严格坚持“质量大于数量”的前提下,目前已增加到四万册。

"Electronic test" witnessed China electronic test and measurement industry. How is the international and domestic market to provide competitive products, to master the advanced measurement technique by test engineers and Research on test and measurement field has been paid, and build a communicationindustry information platform for them to create a broad space, academic exchange is the core mission of electronic test "" since start publication. At present, many research institutes, universities and colleges by the scientific eliteand engaged in microelectronics industry and electronic product development and technical personnel have become loyal readers, we issued in strict adherence to the "premise of quality than quantity", has now increased to forty thousand copies.

电子测试收录情况/影响因子

Electronic test included / influence factor

国家新闻出版总署收录 中国知网、维普中文期刊网、万方期刊数据库、中国核心期刊(遴选)数据库收录

Chinese HowNet, VIP Chinese journal net, Wanfang periodical database, Chinacore journals cited by the General Administration of press and Publication(selection) database

1、科技核心期刊:中国科技核心期刊(2013)

1, the core journals of science and technology: China core journals of science and Technology (2013)

2、数据:MARC数据、DC数据

2, data: MARC data, DC data

3、图书馆藏:国家图书馆馆藏、上海图书馆馆藏

3, the State Library: library, Shanghai Library

4、影响因子:

4, impact factor:

截止2014年万方:影响因子:0.318;总被引频次:350

By the end of 2014 Wanfang: impact factor: 0.318; total cited frequency: 350

截止2014年知网:复合影响因子:0.457;综合影响因子:0.213

By the end of 2014 HowNet: composite impact factor: 0.457; comprehensive influence factor: 0.213

电子测试栏目设置

Set the electronic test columns

设计与研发、虚拟仪器技术、微处理器与编程器件的应用、新品评测特集、测试工具与解决方案、新软件、新硬件、产品咨询与行业新闻、主板技术通报、新上市主板介绍、市场部特别企划、新游戏

Design and development, virtual instrument technology, microprocessor withprogrammable devices, application of new special collection, evaluation and testing tool solution, the new software, hardware, new product consulting andindustry news, motherboard, motherboard, newly introduced technical bulletinmarketing department special planning, a new game
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